Study on Defects of Square Capillary X-ray Lenses or Slices

Abstract

X-ray imaging method as a non-destructive, in-situ, and effective analytical tool plays an important role in material analysis and application. The Square Capillary X-ray Lenses or Slices (SCXLS) as the key optics in X-ray imaging are being studied and reported more and more. In this work, we presented the main defects of SCXLS in the manufacturing process, and gave the corresponding solutions to these defects, which finally enables SCXLS to better enter imaging application for material analysis