Waveguide Probe Loaded with Single Via-Split-Ring Resonator for Defects Detection in Metallic Surfaces
Abstract
In this paper, we propose a near-field waveguide probe loaded with one novel small resonator, which is composed of vias and strips using printed circuit board (PCB) technique and named via-split-ring resonator (VSRR). Measurements are accomplished using one dimension automatic platform and vector network analyzer. Experimental results verify the probe has high sensitivity and good resolution in detecting closely spaced narrow cracks.
Keywords
Waveguide near-field probe, Via-split-ring resonator (VSRR), Nondestructive testing (NDT), Sub-wavelength resolution
DOI
10.12783/dtetr/ameme2017/16209
10.12783/dtetr/ameme2017/16209
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